Technical Day Lyon follow-up

Philippe Albrieux, the president of C.I.F. gave  an interview about their Technical Day held in Lyon. Many of our digital microscopes, SANXO-Scope U15, U16 and Dual-Scope, were tested during the event. The greatest attention was given to the Dr AOI Rapid application which simplifies and makes affordable the PCB automated quality control process.

Full video is available here.

 

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